Ø | CA88电子股份有限公司集团实验室拥有国内一流的功率分立器件及特色IC产品的可靠性及失效分析实验设施,设备,实验室项目参考JEDEC相关标准。 |
Ø | 主要有可靠性实验和失效分析实验两块主要业务。实验室在2025年1月通过CNAS的认证,CNAS22280。 |
实验室对外承接可靠性试验项目:
Ø 温湿度试验(HTSL/PCT/UHAST/THT/TC/TS)
Ø 老化试验(HTRB/HTGB/H3TRB/IOL/HAST)
Ø 封装体完整性测试(RSH/SD/MSL)
Ø 产品特性参数测试(ESD/Surge/Thermal Resistance)
具体测试项目及条件:
NO. |
Stress |
ABV |
Reference |
Test Condition |
Capability |
---|---|---|---|---|---|
1 |
Pre-conditioning |
PC |
JESD22A-113 |
only for SMD product H3TRB, HAST, UHAST, AC, IOL,TC and RSH test items. |
|
2 |
High Temperature Reverse Bias |
HTRB |
JESD22A-108 |
TJ:MAX, 100%VR;Interim readout @168HR,@500HR, final @1000HR; |
Temp: RT~200℃; Voltage:0~2000V; |
3 |
High Temperature Gate Bias |
HTGB |
JESD22A-108 |
TJ:MAX, 100%VGS;Interim readout @168HR,@500HR, final @1000HR; |
Temp: RT~200℃;Voltage:0~100V; |
4 |
High Humidity High Temp. Reverse Bias |
H3TRB |
JESD22A-101 |
85°C, 85%RH, 80%VR;Interim readout @168HR,@500HR, final @1000HR; |
Temp&Humidity: 85℃,85%;Voltage:0~1000V; |
5 |
Temperature Cycling |
TCT |
JESD22A-104 |
-55°C to 150°C, dwell time >=10min;Interim readout @168 cycles,@500 cycles, final @1000 cycles; |
Temp: -70℃~200℃; |
6 |
Autoclave |
AC |
JESD22A-102 |
121°C, 100%RH, 15psig;Final readout @96HR |
|
7 |
Intermittent Operational Life |
IOL |
MIL-STD-750-1037 |
Ta=25°C,2on 2off,∆TJ ≥ 100°C;Interim readout @2520 cycles,@7500 cycles, final @15000 cycles; |
Current: 0~16A |
8 |
Resistance to Solder Heat |
RSH |
JEDEC JESD22-A- |
260°C/10S |
|
9 |
Solderability |
SD |
J-STD-002 |
245°C/5S S≥95% |
|
10 |
Electrostatic Discharge Testing-Human Body Model |
ESD-HBM |
AEC-Q101-001 |
R=1500Ω,C=100PF |
Voltage: 0~8KV |
11 |
Destructive Physical Analysis |
DPA |
AEC-Q101-004 |
H3TRB or HAST, and TCT |
|
12 |
Forward Surge Test |
FS |
MIL-STD-750-4066 |
T:8.3MS |
Current: 0~1KA |
13 |
Thermal Shock |
TS |
JESD22A106B |
-65°C ~ 150°C |
Temp: -70℃~200℃ |
或按照顾客特定要求,如Double AECQ101等.
失效分析实验室:
Ø 开封
Ø 取晶粒
Ø 红墨水试验
Ø X射线透视
Ø 探针测试
Ø 高倍显微镜拍照
Ø 背面研磨
Ø 横截面切片
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